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Results:   Structural Analysis

Structural Analysis: Contact Probe v. LED Scanner

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Relationship between roughness heights determined using a contact probe (Lr-CP) and an LED scanner (Lr-LED). In order to convert the exponential model into a linear model, roughness height values for Lr-CP and Lr-LED were natural log transformed. The resultant linear model, [ln(Lr-CP) = 0.86. ln(Lr-LED) + 0.28], accounts for 70% of the variance.

Structural Analysis: Contact Probe v. Laser Scanner

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Relationship between roughness heights determined using a contact probe (Lr-CP) and a laser scanner (Lr-laser). In order to convert the exponential model into a linear model, roughness height values for Lr-CP and Lr-laser were natural log transformed. The resultant linear model, [ln(Lr-CP) = 1.28. ln(Lr-laser) - 0.11], accounts for 70 % of the variance.

Structural Analysis: Laser Scanner v. LED Scanner

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Relationship between roughness heights determined using a laser scanner (Lr-laser) and an LED scanner (Lr-LED). Roughness height values for Lr-laser and Lr-LED were natural log transformed. The resultant linear model, [Lr-laser = 0.63(Lr-LED) + 0.38] explains 85 % of the variance in the data.